Issue 10, 2007
From the journal:

Analyst

Photoelectrochemical ruler: measurement at the micron scale

Nicole Fietkau,a   Javier del Campo,b   Roser Mas,b   Francesc Xavier Muñozb  and  Richard G. Compton*a  

* Corresponding authors

a Physical and Theoretical Chemistry Laboratory, Oxford University, South Parks Road, Oxford, UK
E-mail: richard.compton@chem.ox.ac.uk
Fax: +44 (0) 1865 275 410
Tel: +44 (0) 1865 275 413

b Centro National de Microelectrónica, IMB-CNM, CSIC, Campus de la Universidad Autónoma de Barcelona, Barcelona, Spain

Abstract

A new approach to the measurement of objects with dimensions in the micron scale is proposed exploiting the spatial sensitivity of electrochemical measurements.

Graphical abstract: Photoelectrochemical ruler: measurement at the micron scale

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Article information

DOI
https://doi.org/10.1039/B711828G
Article type
Communication
Submitted
01 Aug 2007
Accepted
21 Aug 2007
First published
28 Aug 2007

Analyst, 2007,132, 983-985

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Photoelectrochemical ruler: measurement at the micron scale

N. Fietkau, J. del Campo, R. Mas, F. X. Muñoz and R. G. Compton, Analyst, 2007, 132, 983 DOI: 10.1039/B711828G

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