Re-assessment of silicon isotope reference materials using high-resolution multi-collector ICP-MS
Abstract
Silicon isotope ratios can now be measured to very high precision using high-resolution multi-collector
* Corresponding authors
a
IGMR, ETH Zürich, Soneggstrasse 5, Zurich, Switzerland
E-mail:
reynolds@erdw.ethz.ch
Fax: +41 44 632 1179
Tel: +41 44 632 6869
b
Freie Universität Berlin, Malteserstrasse 74-100, Berlin, Germany
E-mail:
wiechert@zedat.fu-berlin.de
Fax: +49 3083 870170
Tel: +49 3083 870351
c
Department of Earth Sciences, University of Oxford, Oxford, UK
E-mail:
alexh@earth.ox.ac.uk
Fax: +44 1865 272072
Tel: +44 1865 272 969
Silicon isotope ratios can now be measured to very high precision using high-resolution multi-collector
B. C. Reynolds, R. B. Georg, F. Oberli, U. Wiechert and A. N. Halliday, J. Anal. At. Spectrom., 2006, 21, 266 DOI: 10.1039/B515908C
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