Issue 24, 2006
From the journal:

Physical Chemistry Chemical Physics

Observation of mechanically induced luminescence from microparticles

Kazufumi Sakai,*a   Toshiaki Koga,a   Yusuke Imai,a   Shouko Maeharaa  and  Chao-Nan Xua  

* Corresponding authors

a National Institute of Advanced Industrial Science and Technology 807-1 Shuku-machi, Tosu, Japan
E-mail: kazufumi-sakai@aist.go.jp
Fax: +81-942-81-3690
Tel: +81-942-81-3621

Abstract

We have invented a new device based on atomic force microscopy that measures the emission from a single microparticle by force direct application using the AFM probe, and successfully observed emission in the region of the elastic deformation, friction, and destructive deformation.

Graphical abstract: Observation of mechanically induced luminescence from microparticles

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Article information

DOI
https://doi.org/10.1039/B604656H
Article type
Communication
Submitted
30 Mar 2006
Accepted
09 May 2006
First published
25 May 2006

Phys. Chem. Chem. Phys., 2006,8, 2819-2822

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Observation of mechanically induced luminescence from microparticles

K. Sakai, T. Koga, Y. Imai, S. Maehara and C. Xu, Phys. Chem. Chem. Phys., 2006, 8, 2819 DOI: 10.1039/B604656H

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