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Characterization of spectral lines in optical emission spectra measured by CCD detectors
Abstract
An algorithm for the calculation of wavelengths and intensities of spectral lines in the CCD spectra is described.
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Article information
- Article type
- Technical Note
- Submitted
- 10 Jan 2005
- Accepted
- 23 Mar 2005
- First published
- 15 Apr 2005
J. Anal. At. Spectrom., 2005,20, 557-558
Permissions
Characterization of spectral lines in optical emission spectra measured by CCD detectors
Z. Weiss, J. Anal. At. Spectrom., 2005, 20, 557 DOI: 10.1039/B500286A
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