Issue 4, 2004

The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy

Abstract

The layer-by-layer roughness of organic light-emitting diode (OLED)-component functional thin films deposited from different solvents by a spin-coating method was studied using atomic force microscopy (AFM) facilities.

Article information

Article type
Communication
Submitted
04 Jun 2004

Mendeleev Commun., 2004,14, 155-157

The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy

O. V. Kotova, S. V. Eliseeva, E. V. Perevedentseva, T. F. Limonova, R. A. Baigeldieva, A. G. Vitukhnovsky and N. P. Kuzmina, Mendeleev Commun., 2004, 14, 155 DOI: 10.1070/MC2004v014n04ABEH001963

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