Oxide ion diffusion in optimised LAMOX materials†
Abstract
A series of optimised materials in the family with parent compound La2Mo2O9 have been studied using the isotope exchange depth profile technique and
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* Corresponding authors
a Laboratoire de Oxydes et Fluorures, UMR CNRS 6010, Université du Maine, Avenue Olivier Messiaen, Le Mans cedex 9, France
b Department of Materials, Imperial College London, Prince Consort Road, London, UK
c Laboratoire de Cristallochimie et Physicochimie des Solides, Ecole Nationale Superieure de Chimie de Lille, BP. 108, Villeneuve d'Ascq, France
A series of optimised materials in the family with parent compound La2Mo2O9 have been studied using the isotope exchange depth profile technique and
S. Georges, S. J. Skinner, P. Lacorre and M. C. Steil, Dalton Trans., 2004, 3101 DOI: 10.1039/B401253D
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