Inelastic X-ray scattering studies of phonons in liquid crystalline DNA†
Abstract
A high resolution X-ray scattering method is used to measure
* Corresponding authors
a
Department of Nuclear Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA
E-mail:
sowhsin@mit.edu
b Department of Chemistry, University of Florence, 50019 Florence, Italy
c Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA
A high resolution X-ray scattering method is used to measure
Y. Liu, D. Berti, A. Faraone, W. Chen, A. Alatas, H. Sinn, E. Alp, A. Said, P. Baglioni and S. Chen, Phys. Chem. Chem. Phys., 2004, 6, 1499 DOI: 10.1039/B314462N
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