Issue 18, 2004
From the journal:

Chemical Communications

Affinity mass spectrometry from a tailored porous silicon surface†

Jun-cai Meng,a   Gary Siuzdaka  and  M. G. Finn*a  

* Corresponding authors

a Department of Chemistry, The Scripps Research Institute, 10550 N. Torrey Pines Rd., La Jolla, CA 92037, USA
E-mail: mgfinn@scripps.edu
Fax: 858-784-8850
Tel: 858-784-8845

Abstract

The development of chemically stable porous silicon (pSi) materials for DIOS (Desorption/Ionization on Silicon) mass spectrometry, covalent linkers cleaved in the DIOS laser pulse, and efficient methods for bond formation to immobilized species, allows for on-chip affinity purification and mass detection.

Graphical abstract: Affinity mass spectrometry from a tailored porous silicon surface

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Article information

DOI
https://doi.org/10.1039/B408200A
Article type
Communication
Submitted
01 Jun 2004
Accepted
16 Jun 2004
First published
05 Aug 2004

Chem. Commun., 2004, 2108-2109

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Affinity mass spectrometry from a tailored porous silicon surface

J. Meng, G. Siuzdak and M. G. Finn, Chem. Commun., 2004, 2108 DOI: 10.1039/B408200A

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