Glow discharge optical emission spectrometry: moving towards reliable thin film analysis–a short review†
Abstract
* Corresponding authors
a
Microstructure and Surface Analysis, voestalpine Stahl GmbH, P.O.3, Linz, Austria
E-mail:
johann.angeli@voestalpine.com
b Swedish Institute for Metals Research, Drottning Kristinas väg 48, SE-114 28 Stockholm, Sweden
c Department of Chemistry, University of Antwerp (UIA), Universiteitsplein 1, B-2610 Wilrijk-Antwerp, Belgium
d Leibniz Institute for Solid State and Materials Research Dresden, P.O. Box 270116, D-01171 Dresden, Germany
e Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, Germany
f London Metropolitan University, 166–220 Holloway Road, London, UK
J. Angeli, A. Bengtson, A. Bogaerts, V. Hoffmann, V. Hodoroaba and E. Steers, J. Anal. At. Spectrom., 2003, 18, 670 DOI: 10.1039/B301293J
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