Ion extraction effects on the in-depth analysis of layered samples by time-of-flight mass spectrometry of laser-induced plasmas

José M. Vadillo; Carmen C. Garcia; Javier Ruiz; J. Javier Laserna

doi:10.1039/B200959E

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José M. Vadillo,*^a Carmen C. Garcia,^a Javier Ruiz^b and J. Javier Laserna^a

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* Corresponding authors

^a Department of Analytical Chemistry, Faculty of Sciences, University of Málaga, Málaga, Spain
E-mail: jmvadillo@uma.es

^b Department of Applied Physics, Faculty of Sciences, University of Málaga, Málaga, Spain

Abstract

The nature of the incoming ion beam is known to affect the sampling efficiency in orthogonal extraction time-of-flight mass spectrometry (OE-TOFMS). In the present work, laser ablation of a layered material (a Zn-coated steel) was performed under identical excitation conditions, and the generated ions were analyzed by OE-TOFMS. Using the same extraction parameters, a clear element-dependent shift in the flight times was observed. The shift only occurred at the interface of the layered sample. An explanation based on the different ablation rates and effective extraction field in the laser plume is presented.

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Article information

DOI: https://doi.org/10.1039/B200959E
Article type: Paper
Submitted: 25 Jan 2002
Accepted: 07 Mar 2002
First published: 09 Apr 2002

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J. Anal. At. Spectrom., 2002,17, 929-932

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