Issue 12, 2002
From the journal:

Physical Chemistry Chemical Physics

An X-ray absorption near edge spectroscopy study of trace amount technetium implanted in apatite

C. Gaillard,†*a   C. Den Auwerb  and  S. D. Conradsonc  

* Corresponding authors

a Institut de Physique Nucléaire de Lyon, CNRS/IN2P3, Villeurbanne cedex, France

b CEA/DRCP/SCPS/LCAM, Marcoule, BP 171, Bagnols-sur-Cèze, France

c Los Alamos National Laboratory, MST Division, Los Alamos, NM, USA

Abstract

We report the characterization of the chemical form of trace amounts of technetium implanted in hydroxyapatite and annealed in air, using X-ray absorption near edge spectroscopy.

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Article information

DOI
https://doi.org/10.1039/B202618J
Article type
Communication
Submitted
15 Mar 2002
Accepted
30 Apr 2002
First published
14 May 2002

Phys. Chem. Chem. Phys., 2002,4, 2499-2500

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An X-ray absorption near edge spectroscopy study of trace amount technetium implanted in apatite

C. Gaillard, C. Den Auwer and S. D. Conradson, Phys. Chem. Chem. Phys., 2002, 4, 2499 DOI: 10.1039/B202618J

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