Issue 8, 2001
From the journal:

Journal of Analytical Atomic Spectrometry

Ramón Fernández-Ruiz*a  and  Juan Capmanyb  

* Corresponding authors

a Servicio Interdepartamental de Investigación, Facultad de Ciencias, Universidad Autónoma de Madrid, Cantoblanco, Spain
E-mail: ramon.fernandez@uam.es

b Departamento de Física y Arquitectura de Computadores, Universidad Miguel Hernandez, Elche, Spain

Abstract

This paper describes a new method for evaluating the mass contents of rare-earth elements used as dopants in LiNbO3 single crystals with respect to Nb. The method is based on the technique of total-reflection X-ray fluorescence (TXRF). The method presented does not require chemical manipulation of the samples and is rapid (30 min sample preparation and 10 min analysis), precise (between 2 and 8% of variation coefficient) and simple.

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Article information

DOI
https://doi.org/10.1039/B102880B
Article type
Technical Note
Submitted
29 Mar 2001
Accepted
22 May 2001
First published
16 Jul 2001

J. Anal. At. Spectrom., 2001,16, 867-869

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Determination of the rare-earth∶Nb mass ratio in doped LiNbO3 by the TXRF technique

R. Fernández-Ruiz and J. Capmany, J. Anal. At. Spectrom., 2001, 16, 867 DOI: 10.1039/B102880B

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