Issue 10, 2001
From the journal:

Analyst

Determination of the stoichiometry of CuxInySez by total-reflection XRF

R. Fernández-Ruiz,*a   J. P. Cabañero,a   E. Hernándezb  and  M. Leónc  

* Corresponding authors

a Servicio Interdepartamental de Investigación, Facultad de Ciencias, Universidad Autónoma de Madrid, Cantoblanco, Madrid, Spain.
E-mail: ramon.fernandez@uam.es

b Departamento de Física, Fac. Exp. de Ciencias, Universidad del Zulia, Apdo. 526, Maracaibo, Venezuela

c Departamento de Física Aplicada, Facultad de Ciencias, Universidad Autónoma de Madrid, Cantoblanco, Madrid, Spain

Abstract

A rapid and accurate total-reflection XRF method was developed in order to determine the absolute stoichiometry of ternary compounds of the type Cu∶In∶Se. The method was used to determine the composition of the synthesised compounds CuxInyS ez(CIS). Three compounds were synthesised with different atomic proportions x∶y∶z; 1∶3∶5, 2∶4∶7 and the no stoichiometric phase 1∶2.5∶4.75. The results obtained showed a systematic deficiency of In and an increment of Se with respect to the stoichiometric formula.

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Article information

DOI
https://doi.org/10.1039/B104466B
Article type
Paper
Submitted
21 May 2001
Accepted
20 Jul 2001
First published
25 Sep 2001

Analyst, 2001,126, 1797-1799

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Determination of the stoichiometry of CuxInySez by total-reflection XRF

R. Fernández-Ruiz, J. P. Cabañero, E. Hernández and M. León, Analyst, 2001, 126, 1797 DOI: 10.1039/B104466B

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