Issue 8, 2001

Effect of pre-treatment on the surface and electrochemical properties of screen-printed carbon paste electrodes

Abstract

The effect of various electrochemical pre-treatment methods on the surface and electrochemical properties of screen-printed carbon paste electrodes (SPCE) prepared with three different commercial products was examined. It was observed that a positively charged redox couple, e.g., hexaammineruthenium(III), exhibited quasi-reversible behavior at the untreated SPCE. However, the cyclic voltammograms (CVs) of the SPCE prepared with general-purpose carbon inks did not exhibit clear redox peaks to other representative redox couples [e.g., hexacyanoferrate(III), hexachloroiridate(IV), dopamine, and hydroquinone] without activation. Electrochemical pre-treatment methods were sought in four different aqueous solutions, i.e., sulfuric acid, potassium chloride, sodium hydrogencarbonate, and sodium carbonate, applying various activation potentials. It was found that the pre-treatment procedure in saturated Na2CO3 solution at 1.2 V provides a mild and effective condition for activating the SPCE. By measuring the water contact angles at the SPCE surfaces and recording their SEM images, it was confirmed that the electrochemical pre-treatment effectively removes the organic binders from the surface carbon particles. A prolonged period of activation (>5 min) or the use of high potentials (>1.2 V) increased the capacitance of the electrode over 20 μF cm−2. The pre-treated SPCE behaved like a random array microelectrode, exhibiting a sigmoidal-shaped CV at a slow scan rate. The short pre-anodization method in Na2CO3 solution was generally applicable to most SPCE prepared with general-purpose carbon inks.

Article information

Article type
Paper
Submitted
30 Mar 2001
Accepted
24 May 2001
First published
16 Jul 2001

Analyst, 2001,126, 1399-1403

Effect of pre-treatment on the surface and electrochemical properties of screen-printed carbon paste electrodes

G. Cui, J. H. Yoo, J. S. Lee, J. Yoo, J. H. Uhm, G. S. Cha and H. Nam, Analyst, 2001, 126, 1399 DOI: 10.1039/B102934G

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