Abstract
The Rietveld method, extended by a Fourier analysis of line profiles
on the basis of the Warren–Averbach method, has been used for analysing
the
* Corresponding authors
a Laboratoire de Chimie-Physique, Faculté des Sciences Semlalia, Université Cadi Ayyad, B.P. 2390, Marrakech, Morocco
b
School of Science & Engineering, Al Akhawayn University, PO Box 1871, Ifrane, Morocco
E-mail:
a.legrouri@alakhawayn.ma
c Laboratoire des Matériaux Inorganiques, UPRES-A 6002, Université Blaise Pascal, Aubière-Cedex, France
The Rietveld method, extended by a Fourier analysis of line profiles
on the basis of the Warren–Averbach method, has been used for analysing
the
Shape and size determination for zinc–aluminium–chloride
layered double hydroxide crystallites by analysis of
A. Ennadi, A. Legrouri, A. De Roy and J. Pierre Besse, J. Mater. Chem., 2000, 10, 2337 DOI: 10.1039/B003321I
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