Issue 3, 1999

Development of low-energy X-ray fluorescence micro-distribution analysis using a laser plasma X-ray source and multilayer optics

Abstract

A new technique is presented for low-energy X-ray fluorescence micro-distribution analysis of low-Z elements at micrometer spatial resolutions. The technique is based on the use of a laser plasma X-ray source and spherically curved multilayer optics. A large collimator is used to focus the light from the laser plasma on the sample and a Schwarzschild mirror set is used to image the fluorescent radiation on a 2D CCD unit. A first system, now under development, is designed for detection of the carbon Kα-line. The system consists of a Cr/Sc collimator of 260 mm diameter, focusing 0.7 sr of the light from the plasma on the sample, and an Fe/C Schwarzschild mirror set with 20× magnification for detection of the carbon in the sample. A resolution in the micrometer range is expected to be achievable, with a detection limit of a few per cent. Upgrading of this system is expected to result in sub-micrometer resolution and a detection limit in the ppm range.

Article information

Article type
Paper

J. Anal. At. Spectrom., 1999,14, 387-390

Development of low-energy X-ray fluorescence micro-distribution analysis using a laser plasma X-ray source and multilayer optics

R. Stuik, L. A. Shmaenok, H. Fledderus, S. S. Andreev, E. A. Shamov, S. Yu. Zuev, N. N. Salashchenko and F. Bijkerk, J. Anal. At. Spectrom., 1999, 14, 387 DOI: 10.1039/A807614F

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