Issue 9, 1998

Multi-element analysis of environmental samples by X-ray fluorescence spectrometry using a simple thin-layer sample preparation technique

Abstract

A simple and rapid method was developed for the simultaneous multi-element (Na, Mg, Al, Si, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Br, Cd and Pb) analysis of environmental samples, such as vehicle exhaust particulates and atmospheric dust, by X-ray fluorescence (XRF) spectrometry using a simple thin-layer sample preparation technique. A portion of vehicle exhaust particulates or atmospheric dust CRM was suspended in a small volume of a dispersant on a hydrophilized poly(tetrafluoroethylene) (PTFE) membrane filter, dispersed by air blown from a pump and dried by IR irradiation. The resulting filter was sandwiched between two PTFE rings and a polycarbonate–dichloromethane solution was dropped onto the filter to obtain good resistance to X-ray irradiation. The XRF measurements of the specimens gave reasonable reproducibilities. Calibration graphs of analyte elements were obtained from XRF measurements of thin-layer standard specimens, prepared by impregnating activated carbon powder with standard solutions of the elements and then drying the powder. Analytical results obtained without matrix correction were in good agreement with the certified values.

Article information

Article type
Paper

Analyst, 1998,123, 1813-1816

Multi-element analysis of environmental samples by X-ray fluorescence spectrometry using a simple thin-layer sample preparation technique

T. Kyotani, Analyst, 1998, 123, 1813 DOI: 10.1039/A803706J

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