Extraction of extended X-ray absorption fine structure information from the experimental data using the wavelet transform

Abstract

A novel method for extracting the extended X-ray absorption fine structure (EXAFS) information from a measured absorption spectrum is proposed. Owing to the dual localization characteristic of the wavelet transform, the EXAFS oscillation information can be easily retrieved from the experimental spectrum by means of wavelet decomposition. The spectra of a Cu sample have been analyzed by use of the method. Compared with the conventional method, the wavelet transform method is proved to be convenient and fast in retrieving the oscillation, and results obtained by the method are reasonable.