Zn K-edge EXAFS study of SILAR-grown zinc sulfide thin films

Abstract

Zinc sulfide thin films grown by the successive ionic layer adsorption and reaction (SILAR) method have been characterized by extended X-ray absorption fine structure (EXAFS) measurements. The ZnS films were well crystallized even as-grown but annealing improved the crystallinity clearly. The films contained small amounts of oxygen and, according to the EXAFS results, oxygen in the SILAR-grown zinc sulfide thin films occurred as hydroxide ions both in the as-grown and in the annealed samples. The simulated radial distribution curves for two models, Zn(OH) ₂ /ZnS and ZnO/ZnS, were calculated to analyse the film composition. The ZnS thin films were also characterized by IR and electron spectroscopy for chemical analysis (ESCA) measurements.