Application of a Rapid Sequential Inductively Coupled Plasma Optical Emission Spectrometric Method for the Analysis of Materials With Linerich Emission Spectra by Different Means of Sample Introduction

Abstract

Rapid sequential atomic emission spectrometry with the IMAGE system (ISA Jobin Yvon, Longjumeau, France) in combination with an inductively coupled plasma is described. As analytical figures of merit the precision, limits of detection, spectral resolution and linear dynamic range are discussed in comparison with those of conventional sequential spectrometry. The IMAGE system is shown to allow a registration of the emission spectrum in the wavelength range 165–750 nm in less than 2 min (compared with several hours when applying conventional slew times and scanning at similarly high resolution) without any loss of spectral resolution. Thus, spectral interferences can easily be detected, suitable lines for quantitative determinations can be selected and standard solutions used for calibration could even be adapted ‘on-line’ to the matrix of the sample to be analyzed. However, a deterioration in the detection limits by a factor of 3–10 has to be taken into account. Results are given for several means of sample introduction. It is shown for a solution of 2 mg l^–1 Fe in the presence of a 5000-fold excess of Zr that the method can be used for accurate quantitative determinations at the minor and trace element concentration level in work with solutions and slurries. For laser ablation coupled to ICP-OES of briquetted ZrO₂ ceramic powders, the potential for qualitative multi-element survey analysis from a large number of laser impacts is shown.