Issue 17, 1997

Reversible structural change of Rh particles supported on GeO2 submonolayers–SiO2 in reduction and oxidation by XAFS, XRD, TEM and FTIR

Abstract

The behaviors of Rh particles and GeO 2 submonolayers supported on SiO 2 during oxidation and reduction have been investigated, revealing a structural change in the outermost support surface of supported metal catalysts, by means of XAFS, XRD, TEM and FTIR. Partial reduction of the GeO 2 overlayers in Rh/GeO 2 /SiO 2 occurred to form RhGe alloy particles by reduction with H 2 at 423–723 K, as proved by direct Rh–Ge bonding observed by EXAFS at both the Rh- and the Ge-K edges. The RhGe alloy particles were transformed to Rh oxides and GeO 2 submonolayers by calcination at 673 K; conversely, these oxide phases were converted back to RhGe alloy particles by reduction at 423–723 K. These transformations on SiO 2 took place reversibly during the oxidation–reduction treatments. This is a unique structural change at the Rh/GeO 2 overlayer interface in contrast to the behaviors of Rh and Ge on bulk GeO 2 which were irreversible owing to subsidence of Rh into the GeO 2 bulk.

Article information

Article type
Paper

J. Chem. Soc., Faraday Trans., 1997,93, 3217-3227

Reversible structural change of Rh particles supported on GeO2 submonolayers–SiO2 in reduction and oxidation by XAFS, XRD, TEM and FTIR

K. Okumura, N. Ichikuni, K. Asakura and Y. Iwasawa, J. Chem. Soc., Faraday Trans., 1997, 93, 3217 DOI: 10.1039/A701700F

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