Laser ablation sampling with inductively coupled plasma atomic emission spectrometry for the analysis of prototypical glasses

Abstract

Laser ablation sampling is presented as an alternative to dissolution procedures for elemental analyses of prototypical glasses using inductively coupled plasma atomic emission spectrometry. These glass samples were prototypes of vitrified waste products from the Savannah River Technology Center. The samples were not translated or rotated during laser sampling, but were repetitively sampled at a single spot using a KrF excimer laser with a 10 Hz repetition rate. The time-dependent mass ablation rate was measured and is discussed. Silicon, the major element in the matrix, was used as an internal standard, and excellent precision (s_r= 1–3%) was obtained. Quantitative analysis was demonstrated using known prototypical glass compositions. Preferential vaporization was investigated by comparing measured elemental ratios using a nanosecond excimer laser (λ= 248 nm) and a picosecond Nd: YAG laser (fourth harmonic, λ= 266 nm).