Particle-induced X-ray emission: thick-target analysis of inorganic materials in the determination of light elements

Abstract

Particle-induced X-ray emission (PIXE) has been applied to the analysis of inorganic materials to determine some elements with Z<27: Na, Mg, Al, Si, K, Ca, Ti, Mn and Fe, in thick-target analysis. A PIXE method has been developed for the analysis of geological materials, ceramics and pottery. Work has been carried out with an ion beam analytical system, using a low particle beam energy. Relative sensitivity, detection limits, reproducibility and accuracy of the method were calculated based on the analysis of geological standard materials (river sediments, argillaceous limestone, basalt, diorite and granite). Analysis using PIXE offers a number of advantages, such as short analysis time, multi-elemental and non-destructive determinations, and the results are similar to those obtained with other instrumental techniques of analysis.