Jump to main content
Jump to site search
PLANNED MAINTENANCE Close the message box

Scheduled maintenance work on Wednesday 27th March 2019 from 11:00 AM to 1:00 PM (GMT).

During this time our website performance may be temporarily affected. We apologise for any inconvenience this might cause and thank you for your patience.

Issue 4, 1991
Previous Article Next Article

Characterization of conducting polymer–quartz composites


We have characterized several polypyrrole–quartz and polyaniline–quartz composites over a range of conducting-polymer loading levels by thermogravimetric analysis (TG), Rutherford backscattering spectrometry (RBS), scanning electron microscopy (SEM), scanning tunnelling microscopy (STM) and conductivity measurements. It is shown that the conducting polymer overlayers are remarkably thin and uniform; film thicknesses were determined independently by TG and RBS and are in close agreement. The film thickness of one of the polypyrrole–quartz samples was used to obtain the first direct measurement of the conductivity of the polypyrrole component (ca. 35 Ω–1 cm–1).

Back to tab navigation

Article type: Paper
DOI: 10.1039/JM9910100525
Citation: J. Mater. Chem., 1991,1, 525-529

  •   Request permissions

    Characterization of conducting polymer–quartz composites

    S. P. Armes, S. Gottesfeld, J. G. Beery, F. Garzon, C. Mombourquette, M. Hawley and H. H. Kuhn, J. Mater. Chem., 1991, 1, 525
    DOI: 10.1039/JM9910100525

Search articles by author