Direct analysis of slags by inductively coupled plasma atomic emission spectrometry using slurry sample introduction techniques

Abstract

A practical method is described for the direct determination of Si, Ca, Mg, Al, Fe, Mn, Ti, Na and K in slag samples by the introduction of sample suspensions into the inductively coupled plasma atomic emission spectrometer. The effect of the particle size distribution on the atomization efficiency of these elements when slurries of the slag samples were aspirated into the plasma has been studied. The slurry samples were prepared by dispersing 0.1 g of ground slag in 100 ml of 0.35% ammonia solution; calibration was achieved by the use of a reference slag prepared in the same manner. The results obtained for the direct analysis of slag slurries using such a procedure were in good agreement with those obtained by classical dissolution of the sample. The reproducibility of the results with slurry nebulization (concentration range 1.7–5.5%) were poorer than those observed with aqueous solutions (concentration range 0.5–4.8%) but were acceptable for slag industrial control.