Multi-wavelength detection in gas chromatography with microwave-induced plasma atomic emission Fourier transform spectrometry

Abstract

A Fourier transform (FT) spectrometer coupled with a microwave-induced plasma (MIP)(generated by a surfatron) is used as an element-specific detector for the determination of non-metals by gas chromatography. The potential of the MIP-FTS system to detect co-eluting compounds selectively by monitoring different atomic emission lines is described. The multi-wavelength capability of this system allows multi-line analysis for each element, which improves the signal to background noise ratio. Calibration graphs obtained from the emission at a single line and those obtained by multi-wavelength analysis exhibit good linearity and correlation coefficients. The limits of detection for Cl, Br, I and S are measured with FTS and are compared with those obtained using a dispersive single channel detector.