Determination of Germanium by hydride generation inductively coupled plasma atomic emission spectrometry combined with flow injection

Abstract

Hydride generation inductively coupled plasma atomic emission spectrometry combined with flow injection using a membrane gas-liquid separation technique, was applied to the determination of trace levels of Ge. Sodium tetrahydroborate(III) and phosphate buffer (pH 6.5) solutions were used as reductants. When 1 cm³ of sample was used, Ge could be determined with a detection limit (SNR = 3) of 0.4 ng and a relative standard deviation of 3–4%. Approximately 150 samples could be analysed in 1 h. Interferences from the transition metal ions could be reduced with EDTA and those from the hydride forming elements were found to be insignificant. The proposed method was applied to the determination of Ge in GaAs semiconductor materials and to acid extracts of a polyethylene terephthalate.