Automatic matrix dependent wavelength selection in inductively coupled plasma atomic emission spectrometry with multi-line detection

Abstract

The best wavelengths for the determination of desired components in a set of binary and ternary mixtures may be selected without prior knowledge of the nature of any interfering components. Automatic line selection allows the matrix dependent tailoring of the lines chosen to the element or elements of interest. Factor analysis facilitates the selection process by identifying those wavelengths where an unidentified interferent contributes to the measured intensity. A multivariate analysis based on selected wavelengths gives the concentrations of all desired components while avoiding error in these concentrations due to interferents.