Using a range of electron spectroscopic (plasmon, core-electron-edge, X-ray emission) and electron microscopic (high-resolution imaging and optical diffractometry) techniques it is established that unannealed SIPOS is non-crystalline SiO0.50 ± 0.05 and that the annealed form contains microcrystallites of elemental silicon (100Å diameter).
J. Wong, J. M. Thomas, D. A. Jefferson, T. G. Sparrow and E. F. Koch, J. Chem. Soc., Chem. Commun., 1986, 359 DOI: 10.1039/C39860000359
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