Discovery of a new type of layered structure by high resolution electron microscopy and electron-induced X-ray microanalysis

Abstract

Combined high resolution electron microscopy, energy dispersive X-ray emission microanalysis, and computer simulation studies indicate that a layered intermediate phase exists in the Bi–Mo–W–O system, its idealized composition being Bi₂(W,Mo)₁₂O₃₅; the structure consists of Bi₂O₃ sheets interleaved with (W,Mo)₂O₅ sheets which contain crystallographic shear planes that are perpendicular to the layers.