A simple laser scanning system to permit thermal wave imaging of optically thin films by photoacoustic spectrometry is described. The application of this assembly to the examination of surface and subsurface features of laminated films of 6–70 µm thickness is reported.
G. F. Kirkbright and R. M. Miller, Analyst, 1982, 107, 798 DOI: 10.1039/AN9820700798
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