Issue 1258, 1981

Amorphous surface and quantitative X-ray powder diffractometry

Abstract

Experimental quantitation constants for direct quantitative X-ray powder diffractometry, kiJ, are compared with values calculated assuming a model of an ideal crystal. Differences between experimental and calculated kiJ, values demonstrate the existence of significant amounts of amorphous surface in the samples of quartz and corundum investigated.

Using respirable dust specimens from “pure” quartz of diverse origins, kiJ, for the 101 reflection varied from 40.5 to 54.5 net counts cm2µg–1 for the diffractometer conditions used. The maximum value expected for quartz (calculated using Linde A corundum to calibrate the diffractometer for intensity) was only 47 net counts cm2µg–1. After considering all possible influences, the variations in kiJ were attributed to amorphous surface in the quartz, while the higher values than the theoretical maximum found for quartz were attributed to amorphous surface in the corundum. kiJ for both corundum and quartz increased after a hot orthophosphoric acid treatment, while kiJ for quartz decreased with grinding. These results support the amorphous surface concept.

The significance of amorphous surface to quantitative X-ray powder diffractometry is discussed. The likely presence of amorphous surface in powders necessitates that care be taken in the interpretation of quantitative results. It is suggested that theoretically calculated X-ray powder diffraction data may prove useful as a source of quantitation standards that are free of amorphous surface effects.

Article information

Article type
Paper

Analyst, 1981,106, 69-75

Amorphous surface and quantitative X-ray powder diffractometry

S. Altree-Williams, J. G. Byrnes and B. Jordan, Analyst, 1981, 106, 69 DOI: 10.1039/AN9810600069

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