The unique value of X-ray photoelectron diffraction phenomena in determining substitutional patterns in complex monocrystalline solids is demonstrated in studies of naturally occurring layered aluminosilicates.
J. M. Adams, S. Evans and J. M. Thomas, J. Chem. Soc., Chem. Commun., 1978, 210 DOI: 10.1039/C39780000210
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