Issue 1206, 1976

Application of an oscillating-mirror rapid-scanning spectrometer to simultaneous multi-element microwave plasma emission spectrometry

Abstract

The potential value of an oscillating-mirror rapid-scanning spectrometer as a detector for simultaneous multi-element emission spectrometry is demonstrated. A microwave argon plasma was used as the emission source with a carbon cup sampling device for analyte introduction. Analytical graphs for bismuth, cadmium, manganese and magnesium prepared simultaneously are shown. The sensitivity of this system for cadmium, manganese and magnesium is at the nanogram level. The spectrometer has a wide optical range of 200–930 nm that can be scanned in a single sweep and a large dynamic range as radiation is detected by a photomultiplier tube.

Article information

Article type
Paper

Analyst, 1976,101, 753-756

Application of an oscillating-mirror rapid-scanning spectrometer to simultaneous multi-element microwave plasma emission spectrometry

O. Rose, D. W. Mincey, A. M. Yacynych, W. R. Heineman and J. A. Caruso, Analyst, 1976, 101, 753 DOI: 10.1039/AN9760100753

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