It is shown that the presence of distinct SbIII and SbV atoms in the mixed-valency compound Cs2SbCl6 can be directly demonstrated by X-ray photoelectron spectroscopy. The surface purity of the material can be checked by supplementary studies using argon ion bombardment.
P. Burroughs, A. Hamnett and A. F. Orchard, J. Chem. Soc., Dalton Trans., 1974, 565 DOI: 10.1039/DT9740000565
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