Issue 4, 1972

Negative ion production by secondary electrons in a mass spectrometer ion source

Abstract

Experiments on negative ion production by the electron capture process in an ion cyclotron resonance (ICR) mass spectrometer indicate that secondary electrons are responsible for the ionization observed at a primary electron beam energy of 70 eV.

Article information

Article type
Paper

J. Chem. Soc., Chem. Commun., 1972, 245-246

Negative ion production by secondary electrons in a mass spectrometer ion source

T. McAllister, J. Chem. Soc., Chem. Commun., 1972, 245 DOI: 10.1039/C39720000245

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