A technique for determining matrix correction factors and their application to the X-ray fluorescence analysis of low-grade iron ores over a wide range of compositions

Abstract

A new approach is described in which synthetic standards are used to determine factors that are required to correct accurately for matrix effects that occur in the X-ray fluorescence analysis of oxide materials when analysed over a wide range of compositions. This technique enables wider ranges to be analysed than hitherto possible using single calibration graphs for each constituent. The application of the correction factors determined by this technique to the X-ray analysis of a wide range of low-grade iron ore field survey samples is described.