Electron diffraction determination of the molecular structure of tetrasilylhydrazine

Abstract

The structure of tetrasilylhydrazine, (SiH₃)₄N₂, has been determined by the sector microphotometer method of electron diffraction. The data are consistent with planar Si₂NN groups, and a dihedral angle of 82·5 ± 0·8°; the deviation of this angle from 90° may possibly be explained by torsional effects. The Si–H, N–Si, and N–N bond lengths are 1·487 ± 0·014, 1·731 ± 0·004, and 1·457 ± 0·016 Å respectively; the Si–N–Si angle is 129·5 ± 0·7° and the N–Si–H angle is 109·0 ± 1·4°.