Investigation on regeneration kinetics at perovskite/oxide interface with scanning electrochemical microscopy

Abstract

Scanning electrochemical microscopy (SECM) is a powerful technique for quantitative and qualitative investigation of interfacial charge transfer processes. This work presents an SECM investigation on the regeneration kinetics of an organo-metal halide perovskite (CH₃NH₃PbI₃) sensitized onto various semiconductor oxide nanocrystals, including n-type titanium dioxide and p-type nickel oxide. We found for the first time that the regeneration rate constant, and absorption cross section of CH₃NH₃PbI₃ are significantly higher than the conventional sensitizers.