Issue 53, 2017

Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

Abstract

Tip-enhanced Raman scattering (TERS) can be used to image plasmon-enhanced local electric field variations with extremely high spatial resolution under ambient conditions. This is illustrated through TERS images recorded using a silver atomic force microscope tip coated with strategically selected molecular reporters and used to image a sputtered silver film.

Graphical abstract: Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

Supplementary files

Article information

Article type
Communication
Submitted
05 Apr 2017
Accepted
28 Apr 2017
First published
05 Mai 2017

Chem. Commun., 2017,53, 7310-7313

Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

A. Bhattarai and P. Z. El-Khoury, Chem. Commun., 2017, 53, 7310 DOI: 10.1039/C7CC02593A

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