Issue 48, 2022

Laboratory-scale X-ray absorption spectroscopy of 3d transition metals in inorganic thin films

Abstract

In this paper we present laboratory-scale X-ray absorption spectroscopy applied to the research of nanometer-scale thin films. We demonstrate the Cu K edge X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) of CuI and CuO thin films grown with atomic layer deposition. Film thicknesses in the investigated samples ranged from 12 to 248 nm. Even from the thinnest films, XANES spectra can be obtained in 5–20 minutes and EXAFS in 1–4 days. In order to prove the capability of laboratory-based XAS for in situ measurements on thin films, we demonstrate an experiment on in situ oxidation of a 248 nm thick CuI film at a temperature of 240 °C. These methods have important implications for novel and enhanced possibilities for inorganic thin film research.

Graphical abstract: Laboratory-scale X-ray absorption spectroscopy of 3d transition metals in inorganic thin films

Supplementary files

Article information

Article type
Paper
Submitted
12 jul. 2022
Accepted
21 nov. 2022
First published
22 nov. 2022
This article is Open Access
Creative Commons BY license

Dalton Trans., 2022,51, 18593-18602

Laboratory-scale X-ray absorption spectroscopy of 3d transition metals in inorganic thin films

A. Kallio, A. Weiß, R. Bes, M. J. Heikkilä, M. Ritala, M. Kemell and S. Huotari, Dalton Trans., 2022, 51, 18593 DOI: 10.1039/D2DT02264H

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