Yu-Ting
Chow
ab,
Chung-Tzu
Chang
a,
Wen-Yuan
Chan
a,
Chi-Wen
Liu
a,
Pei-Cheng
Jiang
*a,
I-Yu
Cheng
c,
Chao-Yao
Yang
cd and
Cheng-Hsun-Tony
Chang
a
aDepartment of Electronic Engineering, Minghsin University of Science and Technology, Hsinchu 304001, Taiwan
bDepartment of Semiconductor and Electro-Optical Technology, Minghsin University of Science and Technology, Hsinchu 304001, Taiwan
cDepartment of Materials Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu 300093, Taiwan
dCenter for Emergent Functional Matter Science, National Yang Ming Chiao Tung University, Hsinchu 300093, Taiwan. E-mail: jpc77127@must.edu.tw
First published on 10th February 2026
Interfacial engineering remains a critical challenge in flexible spintronics where simultaneously optimizing crystalline quality, magnetic robustness, and proximity effects is difficult. By depositing cobalt films under constant adatom kinetic energy onto flexible substrates with contrasting enthalpies of fusion—muscovite mica (high ΔHf) and perfluoroalkoxy alkane (PFA, low ΔHf)—we demonstrate a thermodynamics-driven strategy to control growth mode, surface roughness, microstructure, and spin coupling. Atomic force microscopy and X-ray diffraction reveal layer-by-layer growth with low roughness on mica (Ra ≈ 1.7–2.3 nm) versus island-like rough morphologies on PFA (Ra up to 47.7 nm). Magnetic measurements show a 50% enhancement of coercive force and mechanical flexibility on PFA, while Pt capping layers amplify magnetic proximity effects more significantly on rougher PFA interfaces. We introduce the Thermal-Informed Roughness Activation (TIRA) model, linking substrate enthalpy and adatom energy to interfacial roughness and spintronic properties. This framework offers practical design rules for optimizing flexible spintronic devices by balancing crystallinity, magnetic coupling, and bendability.
Thin films were prepared in an ultrahigh-vacuum system with a base pressure of approximately 6 × 10−10 Torr. Substrates were mounted on an unheated stage without intentional substrate bias so that the incident kinetic energy of adatoms remained comparable across all trials. Co was deposited by electron-beam evaporation from a Co source with a purity of 99.99%. During Co deposition, the working pressure was in the 10−9 Torr range. The nominal deposition rate was controlled between 0.03 and 0.10 nm s−1 and monitored in real time with a quartz crystal microbalance (QCM). To ensure accuracy regarding the nominal thickness, the cumulative thickness indicated by the QCM was cross-checked ex situ by X-ray fluorescence (XRF) on representative samples to establish a single-point calibration factor that was used for all thicknesses in this report. The nominal thickness reported herein represents the mass-equivalent thickness of the deposited material. After Co deposition, platinum (Pt) capping layers were deposited in the same vacuum line by magnetron sputtering without breaking vacuum. High-purity argon gas (Ar) served as the sputtering gas. The Ar working pressure and target power were adjusted to obtain a stable rate near 0.10 nm s−1, and a low ion energy was maintained to avoid damage to the Co surface. A Pt thickness series was prepared on both substrate types under identical process conditions for direct comparison.13,14
The surface morphology was characterized by AFM in contact mode using silicon cantilevers. Large-area surveys used 25 × 25 μm2 frames to capture mesoscale clustering on PFA and terrace-flat growth on mica, complemented by smaller frames when we needed to resolve nanoscale features. The arithmetic mean roughness Ra reported here is the average roughness over all frames for a given sample after background plane subtraction and line-by-line de-striping. The crystal structure was examined by XRD using common θ–2θ scans. Co/mica and Co/PFA samples were measured under identical geometrical conditions. Chemical depth distributions were analyzed by SIMS. Depth profiling targeted elemental Co and Pt and characteristic Pt–Co alloy signals. Primary-ion conditions were selected to minimize preferential sputtering and to maintain an approximately linear erosion rate through the film stack. The sputtering time was converted to an approximate depth using calibrated crater depths on the companion samples, enabling qualitative comparison between mica-based and PFA-based stacks. The integrated Pt–Co signal was used as a semi-quantitative proxy for the extent of interfacial alloying. Magnetic measurements were conducted using a SQUID magnetometer at room temperature. Hysteresis loops were obtained with the magnetic field applied in the film plane unless stated otherwise. The coercive force (Hc) was defined from the zero crossings of magnetization (M) in the major loop after background subtraction, and the saturation magnetization (Ms) was obtained from the steady region of the high magnetic field (H) region. To evaluate mechanical flexibility and magneto-mechanical robustness, bending tests were performed by conformally mounting the samples on cylindrical mandrels with different radii (r); the curvature was quantified as 1/r. For each curvature, three bend-and-release cycles were applied prior to magnetic measurements to eliminate transient seating effects. Hysteresis loops were then re-measured without removing the sample from the mandrel to avoid relaxation. Optical photographs recorded the maximum sustainable curvature for each substrate to confirm the absence or presence of cracking and delamination. Details of the instrumentation and equipment omitted here can be found in our previous work.15–17
This interfacial interaction can be investigated by thermodynamics, which is divided into diffusion, compound, and melting from different energies. There are many reports discussing the interfacial mechanism for diffusion and compound,7–10 so we aim to focus on the related mechanism of melting in this study. The significantly increased surface roughness of Co/PFA may enhance local thermal activation, potentially approaching conditions relevant to surface melting. It is worth noting that the large roughness of the initial PFA substrate may be a minor factor in growth model transition from the viewpoint of atom diffusion. With regard to the enthalpy of fusion, the enthalpies of fusion for evaporated Co, PFA, and mica are 305, 23.5, and 500 J g−1, respectively.21–24 Therefore, the evaporated Co atoms can lead to different deposition mechanisms between PFA and mica surfaces.
The large difference in enthalpy of fusion plays a decisive role. When energetic Co adatoms impinge on the low-ΔHf surface, their kinetic energy is sufficient to induce local thermal activation or softening of the polymer chains. This creates a dynamically unstable interface that inhibits wetting and enhances adatom mobility, driving Co atoms to agglomerate into clusters (Volmer–Weber mode). In contrast, the high-ΔHf mica surface remains thermodynamically rigid, promoting stable adsorption and layer-by-layer (Frank van der Merwe) growth. Since the typical diffusion-induced interfacial layer is thinner than 1 nm25–27 and the observed roughness on PFA reaches ∼47.7 nm, the large-scale morphological evolution is attributed to thermodynamic softening or melting instead of atomic diffusion. Therefore, in this study, we will focus on the effect of interfacial melting and won't take the influence of interfacial compounds into account.
Considering the applications of Co on spintronic devices, in addition to the surface morphologies and roughness, the crystallinity of Co is of the utmost importance. In particular, the structure of hexagonal close packed Co (hcp-Co) can exhibit stable ferromagnetism. Therefore, XRD was employed to investigate the crystallinity of Co/mica and Co/PFA, and the results are shown in Fig. 3a and b, respectively. In Fig. 3a, Co/mica obviously shows the diffraction peak of hcp(002) (black club), which agrees with the previous literature for Co/Si,19,20,28 and the diffraction peaks of mica (black diamonds) can also be clearly observed.29,30 In Fig. 3b, there is no diffraction peak for Co/PFA, which can be attributed to the interfacial interaction. In the previous literature,19,20,31 the crystalline structure can't be measured when Co is deposited on substrates with a low enthalpy of fusion. Considering the great mobility and degree of freedom for the PFA interfaces, Co is epitaxially deposited with difficulty and can only be accumulated in VW mode on PFA, resulting in the absence of any ordered alignment by XRD. This highlights that the thermodynamically unstable PFA interface prevents the stable nucleation required for hcp-phase formation.
After analyzing the surface morphologies and crystalline structures of the dynamic interfaces between Co deposition and the substrate corresponding to the magnetic anisotropy energy (MAE) and defects, the magnetic properties of Co can be investigated. The evolution of coercive force for the Co thickness from 10 to 30 nm on mica (black squares) and PFA (red circles) is shown in Fig. 4a. For both series, the coercive force gradually decreases as the Co thickness increases. From the previous literature, because of the transition from Néel wall to Bloch wall from the magnetization reversal mechanism when depositing ferromagnetic thin films, the coercive force will first increase and then decrease.19,20,32 At the turning point, the Bloch wall gradually replaces the Néel wall and the energy of magnetization reversal decreases due to the increase in thickness of the domain wall, resulting in a decrease of coercive force.
Furthermore, the coercive force of Co/PFA is larger than that of Co/mica by 50% and the curve exhibits an upper-right shift. Considering that the origins of coercive force are MAE and the barrier to domain wall motion, there are more interfacial interactions of Co/PFA because of different substrate properties corresponding to the structures in Fig. 2. The Co thin films exhibit stable but disordered large-sized clusters, and there obviously exist more boundary defects and bigger surface roughness that act as pinning sites for domain walls, resulting in a larger coercive force and the observed delay in the Néel-to-Bloch transition. Simultaneously, because there are more boundary defects, the magnetic domain is separated and the transition from Néel wall to Bloch wall is delayed.19,20,32 Therefore, the behavior of coercive force shifts to the region of larger thickness.
For flexible materials, we investigated the effect of coercive force versus curvature (in Fig. 4b) on magnetic thin films, as shown in Fig. 4c. We can see that there is no obvious influence of slightly bending the sample on coercive force. However, as mica is a crystalline and layered-accumulation substrate, it is hard and brittle; visual inspection confirmed that even slight bending resulted in visible cracking and delamination. On the other hand, no such defects were observed on the Co/PFA films, indicating their superior mechanical robustness. Surprisingly, Co thin films are also flexible on the surface of PFA with stable magnetic properties. Considering that Co follows the FvM mode growth, the magnetic properties are usually influenced by stress, as reported in the previous literature.33–35 Developing magnetic thin films that are not influenced by stress may offer a new route for flexible spintronic applications. It is assumed that the interfaces between Co and PFA shown in Fig. 2 allow Co to be deposited by huge clusters and weaken the interaction between clusters, improving the tolerance to stress changes. This is the first publication of magnetic thin film devices with high flexibility (1/r ≫ 0.5 mm−1).36–38
Then, adding Pt with strong SOC and SHE effects at vacuum/Co interfaces,39–41 we want to realize the boundary conditions at the interfaces between Pt and Co. From the previous literature, the SOC effect will be provided by the single lattice of FvM mode-grown Pt/Co for the interaction between Pt and Co, and it shows the MPE.42,43 The saturation magnetization of Co films without Pt is defined as M0s ≡ MPts (Pt thickness, tPt = 0). As Pt is gradually deposited on top of Co, the saturation magnetization turns out to be MPts (tPt). When the value of
is bigger than 1, the additional magnetic moments from the MPE and the SOC effect at Pt/Co interfaces can be confirmed. In Fig. 5a, for Pt/Co interfaces on both mica and PFA substrates, a significant MPE will be observed (δ ≥ 1). However, when the thickness of Pt is between 10 and 20 nm, there are different observations for the magnetization of Pt/Co interfaces between the mica and PFA substrates. The intensity of the MPE will be enhanced as the Pt thickness increases for Pt/Co on the PFA substrate, while a significant weakening of the intensity of the MPE will be observed for Pt/Co on mica.
![]() | ||
| Fig. 5 The enhancement of (a) magnetization and (b) coercive force of x nm Pt on 30 nm Co/PFA (red circles) and 30 nm Co/mica (black squares). | ||
Considering the surface roughness from Co deposition shown in Fig. 2, when Pt is deposited on top of rougher Co/PFA surfaces, the amount of Pt/Co interfaces is expected to be larger, resulting in a stronger interaction between Pt and Co. However, for the Co/mica system, Co is almost grown in FvM mode on mica, so the Pt/Co interfaces will be limited. Furthermore, as the Pt thickness increases, the competition between the Pt–Pt bond and the Pt–Co bond will be enhanced, resulting in weakening of the MPE from Pt–Co.
On the other hand, the rougher Co/PFA interfaces convert additional Pt into stronger interfacial spin–orbit coupling (SOC)/MPE and enhanced pinning, leading to a gradual increase in coercive force as shown in Fig. 5b. On the other hand, the smoother Co/mica interfaces lead to weakening of the MPE at larger Pt thickness due to Pt–Pt bonding dominance, resulting in a slight increase or saturation of Hc.
In order to confirm that the chemical composition distributions for Pt/Co on mica and PFA are the same as what we expect, depth profiling experiments for Pt/Co on mica and PFA were performed by SIMS as shown in Fig. 6a and b, respectively. We focus on the evolution of Pt, Co, and a Pt–Co alloy as the sputtering time increases. In Fig. 6a, for the chemical composition of Pt/Co on mica, Pt is the richest on the topmost surface, and we can also find the existence of the Pt–Co alloy. As the sputtering time increases, we can find a slight decrease in Pt intensity while the intensities of Co and the Pt–Co alloy increase. This reveals that the vertical chemical distribution comprises a topmost Pt layer, an interfacial Pt–Co alloy, and a bottom Co layer. This is consistent with the thin film deposition. Because Co is first deposited on mica and Pt is deposited on top of Co, the observations of Pt, the Pt–Co alloy, and the Co layer can be predicted. In Fig. 6b, we only replace the mica substrate with PFA, and the depth profiling results are almost the same as those on the mica substrate.
In order to confirm the MPE shown in Fig. 5 results precisely from the evolution of the Pt–Co alloy, we combined the intensities of the Pt–Co alloy in Fig. 6a and b and the result is shown in Fig. 6c. We can determine the maximum intensities of Pt–Co bonding in the series of Pt/Co on the mica and PFA substrates, which are almost the same. However, in the analysis of depth profiling experiments, the intensities of Pt–Co bonding on PFA are obviously larger than those on mica. After integration, the integrated intensity ratio of Pt–Co bonding on PFA and mica is close to 2.0. In Fig. 5a, the enhancements of saturation magnetization (Ms) for Pt/Co on PFA and mica are 40% and 20%, respectively. The ratio between the enhancements of Ms for Pt/Co on PFA and mica is also 2.0. Therefore, we can assume that the enhancements of Ms can be attributed to the Pt–Co bonding, which is consistent with the previous literature on MPE.42,43
In Fig. 6d, the depth profiling of Co intensities of on PFA and mica can be clearly observed. We can find an obvious difference between the Co layer removal of Co/PFA and Co/mica interfaces. From the previous literature, the change in interfacial properties for the two heterogeneous materials can be simply categorized into clear and fuzzy change types.43–45 If there is no diffusion and mixing occurring at the interfaces between heterogeneous materials resulting in a clear interface, the intensity evolution in depth profiling experiments will exhibit an exponential change.43,44 Conversely, if there is some diffusion or mixing at the heterogeneous interfaces resulting in fuzzy interfaces, the intensity evolution in depth profiling experiments will exhibit a linear-like change.44,45 According to the previous literature, the Co intensity evolution in depth profiling experiments shown in Fig. 6d can help us confirm a clear interfacial property without mixing for Co/mica and a fuzzy interfacial property with mixing for Co/PFA, which are in agreement with the AFM images shown in Fig. 2.
The degree of change in interfacial properties is decided by the interaction between the kinetic energy of adatoms and the enthalpy of substrate fusion, resulting in an increase of the contact area and an enhancement of surface reactivity. In order to demonstrate this mechanism, we propose a novel model called the Thermal-Informed Roughness Activation (TIRA) model. From the TIRA model, the surface roughness can be controlled by the interaction between the enthalpy of substrate fusion (ΔHf) and the kinetic energy of adatoms (Ek). When the deposited atoms impinge on different substrates with constant kinetic energy, the interfacial roughness can be expressed by the average roughness (Ra) and decided by the competition between the incident kinetic energy and surface micro-reconstruction of the substrate.
The competition can be described by the TIRA model with a dimensionless activation eqn (1):
| χ ≡ Ek/αΔHf | (1) |
| A(χ) = 1 − e−χn | (2) |
![]() | (3) |
| Ra(t) = Ra,∞(1 − e−t/τ) | (4) |
![]() | (5) |
Predicting simply using eqn (5), Ra,∞ will increase with the inverse of αΔHf with constant Ek representing the substrate with low ΔHf being more easily roughened, which is consistent with the experimental results. The quantitative consistency between the experimental data and the TIRA scaling directly validates the effectiveness of the model. Under comparable adatom kinetic energy and flux, the TIRA framework predicts that the Ra is inversely proportional to the substrate ΔHf. Using the reported ΔHf values for mica (∼ 500 J g−1) and PFA (∼ 23.5 J g−1),21–24 and the AFM roughness data obtained at equivalent Co thickness, the cross-substrate roughness ratio (PFA/mica = 21 at Co = 30 nm) precisely matches the ΔHf ratio (∼ 21). This one-to-one correspondence without any adjustable parameters suggests that Ra ∝ 1/ΔHf, indicating that the interfacial morphology is thermodynamically governed by ΔHf. Moreover, the complementary SIMS and SQUID results exhibit quantitative scaling with the same trend—where the twofold enhancement in the intensity of the Pt–Co alloy and the corresponding twofold increase in the Ms of Co/PFA further demonstrate that the roughness-activated contact area predicted using the TIRA model directly translates into measurable interfacial and magnetic amplification. To summarize, these findings support that the TIRA model can qualitatively describe and quantitatively predict the evolution of interfacial roughness and its functional consequences for the studied thermodynamic substrates.
In Fig. 7, the schematic plots show the interaction between interfaces and magnetic properties as mentioned in the previous paragraph. According to the TIRA model, when the kinetic energy of deposited atoms is nearly constant, Co follows FvM mode growth on mica, which is the substrate with the higher ΔHf as shown in Fig. 7a and b. The AFM image in Fig. 2a–c implies a low roughness (Ra), whose value is between 1.7 and 2.3 nm, and the XRD patterns in Fig. 3a exactly show the peaks of hcp-Co(002), resulting in a smaller coercive force and earlier transition from Néel wall to Bloch wall as shown in Fig. 4a and limited bending endurance as shown in Fig. 4c. Because the Pt/Co interfaces are smoother, resulting in the smaller effective contact area shown in Fig. 7c, the enhancement of the MPE as the Pt thickness increases is slight, as shown in Fig. 5. The SIMS results reveal the well-defined Pt/Co/mica layering shown in Fig. 6a.
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| Fig. 7 The schematic plots of surface evolution for Pt/Co deposited on (a)–(c) mica and (d)–(f) PFA. | ||
On the other hand, Co is grown in VW mode on PFA as shown in Fig. 7d and e because PFA is the substrate of lower ΔHf, resulting in an enhancement of A(χ) and interface roughening from 24 to 48 nm as shown in Fig. 2. No peaks can be observed in the XRD patterns shown in Fig. 3b. The coercive force for Co/PFA is higher than that for Co/mica by 50% for every thickness and the transition from Néel wall to Bloch wall is postponed as shown in Fig. 4a. The samples still remain stable under bending with a large curvature as shown in Fig. 4c. The rougher Pt/Co interfaces increase the effective contact area as shown in Fig. 7f, resulting in a continuous enhancement of the MPE as the Pt thickness increases, as shown in Fig. 5. The SIMS results reveal a broader depth distribution and an increased integrated intensity of the Pt–Co alloy signal, as shown in Fig. 6. Therefore, these results indicate that the TIRA model may be used to tune ΔHf or increase Ek in order to control A(χ) and Ra, which could be relevant for applications in flexible electronic devices.
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