Issue 17, 2015

Investigation on regeneration kinetics at perovskite/oxide interface with scanning electrochemical microscopy

Abstract

Scanning electrochemical microscopy (SECM) is a powerful technique for quantitative and qualitative investigation of interfacial charge transfer processes. This work presents an SECM investigation on the regeneration kinetics of an organo-metal halide perovskite (CH3NH3PbI3) sensitized onto various semiconductor oxide nanocrystals, including n-type titanium dioxide and p-type nickel oxide. We found for the first time that the regeneration rate constant, and absorption cross section of CH3NH3PbI3 are significantly higher than the conventional sensitizers.

Graphical abstract: Investigation on regeneration kinetics at perovskite/oxide interface with scanning electrochemical microscopy

Supplementary files

Article information

Article type
Paper
Submitted
12 নভে. 2014
Accepted
07 জানু. 2015
First published
08 জানু. 2015

J. Mater. Chem. A, 2015,3, 9216-9222

Investigation on regeneration kinetics at perovskite/oxide interface with scanning electrochemical microscopy

G. Alemu, J. Li, J. Cui, X. Xu, B. Zhang, K. Cao, Y. Shen, Y. Cheng and M. Wang, J. Mater. Chem. A, 2015, 3, 9216 DOI: 10.1039/C4TA06126H

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