Issue 27, 2022

Thick-junction perovskite X-ray detectors: processing and optoelectronic considerations

Abstract

Metal halide perovskites have attracted increasing attention due to their strong stopping power, defect tolerance, large mobility lifetime product, tunable bandgap and simple single-crystal growth via low-cost solution processes, particularly for ionizing radiation detection. Over the past few years, semiconductor-type X-ray detectors based on a variety of perovskites have been developed, showing impressive progress in achieving high sensitivity and low detection limits. In this study, based on the requirement of material properties for high-performance X-ray detectors, we review various materials used for direct detection and summarize the processing techniques and optoelectronic considerations of thick-junction perovskite X-ray detectors. This review also highlights the key challenges facing perovskite X-ray detectors towards real applications and discusses the opportunities, which are promising to explore and may require more research activities.

Graphical abstract: Thick-junction perovskite X-ray detectors: processing and optoelectronic considerations

Article information

Article type
Minireview
Submitted
25 মার্চ 2022
Accepted
20 জুন 2022
First published
05 জুলাই 2022

Nanoscale, 2022,14, 9636-9647

Thick-junction perovskite X-ray detectors: processing and optoelectronic considerations

J. Peng, Y. Xu, F. Yao and Q. Lin, Nanoscale, 2022, 14, 9636 DOI: 10.1039/D2NR01643E

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