Real space probe of short-range interaction between Cr in a ferromagnetic semiconductor ZnCrTe
Abstract
The short-range interaction between Cr atoms was directly examined by scanning tunneling microscopy measurements on a Zn0.95Cr0.05Te film. Our measurements revealed that a Cr atom formed a localized state within the bandgap of ZnTe and this state was broadened for a pair of Cr atoms within a distance of ∼1 nm.