Issue 8, 2014

Angular dependence of the magnetoresistance effect in a silicon based p–n junction device

Abstract

We report a pronounced angular dependence of the magnetoresistance (MR) effect in a silicon based p–n junction device at room temperature by manipulating the space charge region of the p–n junction under a magnetic field. For the p–n junction device with various space charge region configurations, we find that all the angular dependence of the MR effect is proportional to sin2(θ), where the θ is the angle between the magnetic field and the driving current. With increasing the magnetic field and driving current, the anisotropic MR effect is obviously improved. At room temperature, under a magnetic field 2 T and driving current 20 mA, the MR ratio is about 50%, almost one order of amplitude larger than that in the magnetic material permalloy. Our results reveal an interpretation of the MR effect in the non-magnetic p–n junction in terms of the Lorentz force and give a new way for the development of future magnetic sensors with non-magnetic p–n junctions.

Graphical abstract: Angular dependence of the magnetoresistance effect in a silicon based p–n junction device

  • This article is part of the themed collection: ChinaNANO

Supplementary files

Article information

Article type
Paper
Submitted
09 Aug 2013
Accepted
02 Jan 2014
First published
08 Jan 2014

Nanoscale, 2014,6, 3978-3983

Author version available

Angular dependence of the magnetoresistance effect in a silicon based p–n junction device

T. Wang, M. Si, D. Yang, Z. Shi, F. Wang, Z. Yang, S. Zhou and D. Xue, Nanoscale, 2014, 6, 3978 DOI: 10.1039/C3NR04077A

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