Atomic spectrometry update—X-ray fluorescence spectrometry
Abstract
This review demonstrates advances in
- This article is part of the themed collection: Atomic Spectrometry Updates
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* Corresponding authors
a
West X-ray Solutions, 405 Whirlowdale Road, Sheffield S11 9NF, UK
E-mail:
margaretwest@blueyonder.co.uk
b Oxford Instruments X-ray Technology, 360 El Pueblo Road, Scotts Valley, CA 95066, USA
c Vienna University of Technology, Atominstitut, Stadionallee 2, Vienna, Austria
d Faculty of Science, The Open University, Walton Hall, Milton Keynes, UK
e Flemish Institute for Technological Research (VITO), Boeretang 200, Belgium
f AGH University of Science and Technology, Faculty of Physics and Applied, Computer Science, Al. Mickiewicza 30, 30-059 Krakow, Poland
This review demonstrates advances in
M. West, A. T. Ellis, P. J. Potts, C. Streli, C. Vanhoof, D. Wegrzynek and P. Wobrauschek, J. Anal. At. Spectrom., 2012, 27, 1603 DOI: 10.1039/C2JA90045A
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