Issue 27, 2008

Organic field effect transistors from ambient solution processed low molar mass semiconductor–insulator blends

Abstract

The morphology and organic field effect transistor (OFET) properties of two component blends of semi-crystalline 6,13-bis(triisopropylsilylethinyl)pentacene (TIPS-pentacene) with selected amorphous and semi-crystalline side chain aromatic low permittivity insulating binders deposited at room temperature under vacuum from a good solvent are reported. When blended with an amorphous binder there is evidence from X-ray photoelectron spectroscopy (XPS) of a strong interaction between TIPS-pentacene and the binder in the solidified film giving rise to twisted TIPS-pentacene crystals containing dislocations. Due to this strong interaction we see no evidence of segregation of TIPS-pentacene towards the active interface and hence we observe a rapid fall off in saturated hole mobility at an active concentration less than 50 wt%. When blended with a crystalline binder there is no evidence from XPS of any interaction between TIPS-pentacene and the binder in the solidified film. We propose that when a semi-crystalline binder is used, which crystallizes more slowly from solution than TIPS-pentacene, we observe stratification of the active material to both interfaces and as a result retention of saturated hole mobility even down to 10 wt%. The potential applications of the approach are in the formulation of low-cost organic semiconductors whose solution and solid state properties can be fine-tuned by careful binder selection.

Graphical abstract: Organic field effect transistors from ambient solution processed low molar mass semiconductor–insulator blends

Article information

Article type
Paper
Submitted
18 Feb 2008
Accepted
10 Apr 2008
First published
07 May 2008

J. Mater. Chem., 2008,18, 3230-3236

Organic field effect transistors from ambient solution processed low molar mass semiconductor–insulator blends

M. Madec, D. Crouch, G. R. Llorente, T. J. Whittle, M. Geoghegan and S. G. Yeates, J. Mater. Chem., 2008, 18, 3230 DOI: 10.1039/B802801J

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