Issue 1, 2007

In situ identification of a luminescence quencher in an organic light-emitting device

Abstract

We have used in situ Raman spectroscopy to identify a luminescence quencher formed during organic light-emitting device operation. Raman spectroscopy revealed that oxo-bridged dimerization occurs during the operation of [Ru(bpy)3]2+(PF6)2 devices, where bpy is 2,2′-bipyridine. Photoluminescence spectroscopy showed that oxo-bridged dimers such as [Ru(bpy)2(H2O)]2O4+(PF6)4 effectively quench photoluminescence. Comparison of the Raman spectra from devices with the spectra from prepared blended films of [Ru(bpy)3]2+(PF6)2 and [Ru(bpy)2(H2O)]2O4+(PF6)4 demonstrated that sufficient dimerization occurs in the device to account for the luminescence quenching observed upon device driving. Dimerization occurred particularly where oxygen and moisture could penetrate the organic film. Dimerization could be a general failure mode of organic electroluminescent devices that incorporate metal complexes. Understanding failure under device-relevant conditions can lead to the development of materials and devices that are intrinsically more resistant to degradation.

Graphical abstract: In situ identification of a luminescence quencher in an organic light-emitting device

Article information

Article type
Paper
Submitted
15 Sep 2006
Accepted
15 Nov 2006
First published
27 Nov 2006

J. Mater. Chem., 2007,17, 76-81

In situ identification of a luminescence quencher in an organic light-emitting device

J. D. Slinker, J. Kim, S. Flores-Torres, J. H. Delcamp, H. D. Abruña, R. H. Friend and G. G. Malliaras, J. Mater. Chem., 2007, 17, 76 DOI: 10.1039/B613403C

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