Atomic Spectrometry Update—X-Ray Fluorescence Spectrometry

Abstract

This is the first ‘stand-alone’ ASU review of XRF, following its ‘divorce’ from mass spectrometer techniques and it is particularly appropriate to welcome new expertise contributing to this review provided by Peter Wobrauschek and Christina Streli of the Atom Institut, Vienna, and Graham Oliver and Mike Holmes of Ceram Research, Stoke-on-Trent. As in previous years, contributions to the development of XRF continue in abundance. Also as in previous years, we have chosen to highlight particular areas where developments in the technique have been, or are likely to be, most influential. These areas include total reflection XRF, portable and on-line instrumentation, developments in X-ray optics and synchrotron applications and, this year, contributions that cover the centenary of the discovery of X-rays. Within our experience and capabilities, this review covers the most important developments in the field since last year's review.